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ICST
2008
IEEE
14 years 2 months ago
Testing Consequences of Grime Buildup in Object Oriented Design Patterns
Evidence suggests that as software ages the original realizations of design patterns remain in place, and participants in design pattern realizations accumulate “grime” – no...
Clemente Izurieta, James M. Bieman
ICST
2010
IEEE
13 years 7 months ago
Generating Transition Probabilities for Automatic Model-Based Test Generation
—Markov chains with Labelled Transitions can be used to generate test cases in a model-based approach. These test cases are generated by random walks on the model according to pr...
Abderrahmane Feliachi, Hélène Le Gue...
ISCAS
2003
IEEE
96views Hardware» more  ISCAS 2003»
14 years 1 months ago
A novel improvement technique for high-level test synthesis
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
Saeed Safari, Hadi Esmaeilzadeh, Amir-Hossein Jaha...
INTEGRATION
2006
102views more  INTEGRATION 2006»
13 years 8 months ago
A parameterized graph-based framework for high-level test synthesis
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...
JSW
2007
107views more  JSW 2007»
13 years 8 months ago
Reducing Domain Level Scenarios to Test Component-based Software
—Higher-order black box software tests against independent end user domain requirements has become an issue of increasing importance with compositional reuse of software artifact...
Oliver Skroch, Klaus Turowski