203 search results - page 36 / 41 » Test Generation and Fault Localization for Quantum Circuits |
VLSID
1998
IEEE
13 years 11 months ago
1998
IEEE
A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-d...
TVLSI
2008
13 years 7 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
KBSE
2009
IEEE
14 years 2 months ago
2009
IEEE
—We investigate claims and assumptions made in several recent papers about fault localization (FL) techniques. Most of these claims have to do with evaluating FL accuracy. Our in...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...