203 search results - page 37 / 41 » Test Generation and Fault Localization for Quantum Circuits |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
SAC
2008
ACM
13 years 7 months ago
2008
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed testing of high-speed embedded processors testing in an SoC system. For SBST, test rout...
ICDCS
1993
IEEE
13 years 11 months ago
1993
IEEE
In this paper, we propose a diagnostic algorithm for the case where distributed system specifications (implementations) are given in the form of communicating finite state machine...
SRDS
2008
IEEE
14 years 1 months ago
2008
IEEE
Firewalls are the mainstay of enterprise security and the most widely adopted technology for protecting private networks. As the quality of protection provided by a firewall dire...
IEE
2010
13 years 6 months ago
2010
Popular code coverage measures, such as branch coverage, are indicators of the thoroughness rather than the fault detection capability of test suites. Mutation testing is a fault-...