1016 search results - page 101 / 204 » Test Generation for Designs with On-Chip Clock Generators |
VTS
2007
IEEE
14 years 3 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
TOOLS
2000
IEEE
14 years 1 months ago
2000
IEEE
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...
CSREAESA
2008
13 years 10 months ago
2008
To deal with the increasing complexity of embedded real-time systems the model-driven development approach has proven to be beneficial. The reduction of complexity achieved by the ...
IJCNN
2006
IEEE
14 years 3 months ago
2006
IEEE
—The stationarity hypothesis is largely and implicitly assumed when designing classifiers (especially those for industrial applications) but it does not generally hold in practic...
JSS
2008
13 years 7 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...