1016 search results - page 124 / 204 » Test Generation for Designs with On-Chip Clock Generators |
FPL
2009
Springer
14 years 1 months ago
2009
Springer
Although there are many neural network FPGA architectures, there is no framework for designing large, high-performance neural networks suitable for the real world. In this paper, ...
AAAI
2007
13 years 11 months ago
2007
Much of artificial intelligence research is focused on devising optimal solutions for challenging and well-defined but highly constrained problems. However, as we begin creating...
JIRS
2010
13 years 7 months ago
2010
Civilian applications for UAVs will bring these vehicles into low flying areas cluttered with obstacles such as building, trees, power lines, and more importantly civilians. The h...
ITC
1997
IEEE
14 years 1 months ago
1997
IEEE
Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot sig...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...