1016 search results - page 136 / 204 » Test Generation for Designs with On-Chip Clock Generators |
AE
2009
Springer
13 years 10 months ago
2009
Springer
Abstract. This paper presents a new Memetic Algorithm (MA) designed to compute near-optimal solutions for the covering array construction problem. It incorporates several distingui...
CAI
2004
Springer
13 years 8 months ago
2004
Springer
A complete hardware implementation of an evolvable combinational unit for FPGAs is presented. The proposed combinational unit consisting of a virtual reconfigurable circuit and evo...
ICFEM
2005
Springer
14 years 2 months ago
2005
Springer
Abstract. Theorem provers, model checkers, static analyzers, test generators. . . all of these and many other kinds of formal methods tools can contribute to the analysis and devel...
RTAS
2009
IEEE
14 years 3 months ago
2009
IEEE
Embedded systems in safety-critical environments demand safety guarantees while providing many useful services that are too complex to formally verify or fully test. Existing appl...
ASPDAC
2004
ACM
14 years 21 days ago
2004
ACM
The design of complex systems is largely ruled by the time needed for verification. Even though formal methods can provide higher reliability, in practice often simulation based ve...