1016 search results - page 14 / 204 » Test Generation for Designs with On-Chip Clock Generators |
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
WSNA
2003
ACM
14 years 26 days ago
2003
ACM
We consider the problem of synchronization of all clocks in a sensor network, in the regime of asymptotically high node densities. We formulate this problem as one in which all cl...
ICCAD
2010
IEEE
13 years 5 months ago
2010
IEEE
Clock network construction is one key problem in high performance VLSI design. Reducing the clock skew variation is one of the most important objectives during clock network synthe...
ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
ACMSE
2006
ACM
14 years 1 months ago
2006
ACM
Like in other fields, computer products (applications, hardware, etc.), before being marketed, require some level of testing to verify whether they meet their design and function...