1016 search results - page 29 / 204 » Test Generation for Designs with On-Chip Clock Generators |
129
Voted
SPIN
2004
Springer
15 years 9 months ago
2004
Springer
We propose a new framework for black-box conformance testing of real-time systems, where specifications are modeled as nondeterministic and partially-observable timed automata. We...
140
Voted
TC
1998
15 years 3 months ago
1998
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
132
Voted
SIGSOFT
2007
ACM
16 years 4 months ago
2007
ACM
The testing of the performance of opportunistic communication protocols and applications is usually done through simulation as i) deployments are expensive and should be left to t...
116
Voted
GPCE
2003
Springer
15 years 9 months ago
2003
Springer
A primary goal of generative programming and model-driven ent is to raise the level of abstraction at which designers and developers interact with the software systems they are bui...
116
Voted
TCAD
2010
14 years 10 months ago
2010
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...