1016 search results - page 29 / 204 » Test Generation for Designs with On-Chip Clock Generators |
SPIN
2004
Springer
14 years 1 months ago
2004
Springer
We propose a new framework for black-box conformance testing of real-time systems, where specifications are modeled as nondeterministic and partially-observable timed automata. We...
TC
1998
13 years 7 months ago
1998
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
SIGSOFT
2007
ACM
14 years 8 months ago
2007
ACM
The testing of the performance of opportunistic communication protocols and applications is usually done through simulation as i) deployments are expensive and should be left to t...
GPCE
2003
Springer
14 years 26 days ago
2003
Springer
A primary goal of generative programming and model-driven ent is to raise the level of abstraction at which designers and developers interact with the software systems they are bui...
TCAD
2010
13 years 2 months ago
2010
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...