1016 search results - page 32 / 204 » Test Generation for Designs with On-Chip Clock Generators |
PDSE
1998
13 years 9 months ago
1998
The development of correct OO distributed software is a daunting task as soon as the distributed interactions are not trivial. This is due to the inherent complexity of distribute...
MTV
2005
IEEE
14 years 1 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
FSE
2005
Springer
14 years 1 months ago
2005
Springer
In this paper we present a distinguisher targeting towards irregularly clocked filter generators. The attack is applied on the irregularly clocked stream cipher called LILI-II. LI...
ICSE
2007
IEEE-ACM
14 years 7 months ago
2007
IEEE-ACM
This paper presents a new automated model-driven technique to generate test cases by using feedback from the execution of a "seed test suite" on an application under tes...
GECCO
2004
Springer
14 years 1 months ago
2004
Springer
Abstract. The need for effective testing techniques for architectural level descriptions is widely recognised. However, due to the variety of domain-specific architectural descript...