1016 search results - page 48 / 204 » Test Generation for Designs with On-Chip Clock Generators |
COMPSEC
2004
13 years 7 months ago
2004
Abstract Up to now biometric methods have been used in cryptography for authentication purposes. In this paper we propose to use biological data for generating sequences of random ...
KBSE
2008
IEEE
14 years 2 months ago
2008
IEEE
—Automatic white-box test generation is a challenging problem. Many existing tools rely on complex code analyses and heuristics. As a result, structural features of an input prog...
ITC
1989
IEEE
13 years 11 months ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
FPGA
2004
ACM
13 years 11 months ago
2004
ACM
Field Programmable Gate Arrays (FPGAs) are an increasingly popular choice of platform for the implementation of cryptographic systems. Until recently, designers using FPGAs had le...