1016 search results - page 60 / 204 » Test Generation for Designs with On-Chip Clock Generators |
COMPSAC
2006
IEEE
14 years 1 months ago
2006
IEEE
Web applications have become complex and crucial in many fields. In order to assure their quality, a high demand for systematic methodologies of Web application testing is emergin...
DSD
2007
IEEE
14 years 2 months ago
2007
IEEE
In this paper, the methodology for automated design of checker for communication protocol testing is presented. Based on the level of checking, different design strategies can be ...
ACSAC
2001
IEEE
13 years 11 months ago
2001
IEEE
Vulnerabilities in distributed applications are being uncovered and exploited faster than software engineers can patch the security holes. All too often these weaknesses result fr...
TASE
2011
IEEE
12 years 11 months ago
2011
IEEE
Abstract—A fast offset surface generation approach is presented in this paper to construct intersection-free offset surfaces, which preserve sharp features, from freeform triangu...
RE
2008
Springer
13 years 7 months ago
2008
Springer
Early phases of software development are known to be problematic, difficult to manage and errors occurring during these phases are expensive to correct. Many systems have been deve...