1016 search results - page 66 / 204 » Test Generation for Designs with On-Chip Clock Generators |
RSP
1998
IEEE
14 years 6 hour ago
1998
IEEE
The complexity of distributed systems is a problem when designers want to evaluate their safety and liveness. Often, they are built by integration of existing components with newl...
GI
2001
Springer
14 years 7 days ago
2001
Springer
We present a pragmatic approach using formal methods to increase the quality of distributed component based systems: Based on UML class diagrams annotated with OCL constraints, co...
ACL
2003
13 years 9 months ago
2003
An investment of effort over the last two years has begun to produce a wealth of data concerning computational psycholinguistic models of syntax acquisition. The data is generated...
VLSID
2004
IEEE
14 years 8 months ago
2004
IEEE
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
CODES
2008
IEEE
13 years 9 months ago
2008
IEEE
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...