1016 search results - page 68 / 204 » Test Generation for Designs with On-Chip Clock Generators |
GI
2007
Springer
13 years 11 months ago
2007
Springer
: Test-case generation with model-checkers is a promising field of research in software testing. Model-checker based approaches offer many advantages: They are fully automated, the...
ICES
2000
Springer
13 years 11 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
SIGMOD
2010
ACM
13 years 11 months ago
2010
ACM
A database application differs form regular applications in that some of its inputs may be database queries. The program will execute the queries on a database and may use any re...
ITC
2002
IEEE
14 years 20 days ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
TVLSI
2008
13 years 7 months ago
2008
Much effort in register transfer level (RTL) design has been devoted to developing "push-button" types of tools. However, given the highly complex nature, and lack of con...