1016 search results - page 79 / 204 » Test Generation for Designs with On-Chip Clock Generators |
DAC
1996
ACM
14 years 1 months ago
1996
ACM
: We presentdesign-for-low-power techniques based on glitch reduction for register-transfer level circuits. We analyze the generation and propagation of glitches in both the contro...
ACMSE
2004
ACM
14 years 2 months ago
2004
ACM
This paper presents a specification-driven approach to test automation for GUI-based JAVA programs as an alternative to the use of capture/replay. The NetBeans Jemmy library provi...
IJOE
2007
13 years 9 months ago
2007
: An environment targeted to e-learning is presented for teaching design and test of electronic systems. The environment consists of a set of Java applets, and of web based access ...
KBSE
2007
IEEE
14 years 3 months ago
2007
IEEE
Achieving high structural coverage such as branch coverage in objectoriented programs is an important and yet challenging goal due to two main challenges. First, some branches inv...
IEEEPACT
2000
IEEE
14 years 1 months ago
2000
IEEE
Modern computers have taken advantage of the instruction-level parallelism (ILP) available in programs with advances in both architecture and compiler design. Unfortunately, large...