1016 search results - page 93 / 204 » Test Generation for Designs with On-Chip Clock Generators |
CHI
2009
ACM
14 years 9 months ago
2009
ACM
This proposal describes the early phase of our design process developing a robot cell-phone named CALLY, with which we are exploring the roles of facial and gestural expressions o...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
DELTA
2004
IEEE
14 years 24 days ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
ISSTA
2004
ACM
14 years 2 months ago
2004
ACM
Object oriented programming promotes reuse of classes in multiple contexts. Thus, a class is designed and implemented with several usage scenarios in mind, some of which possibly ...
KBSE
2002
IEEE
14 years 2 months ago
2002
IEEE
In this paper we present a concept for automated testing of object-oriented applications and a tool called SeDiTeC that implements these concepts for Java applications. SeDiTeC us...