1016 search results - page 99 / 204 » Test Generation for Designs with On-Chip Clock Generators |
DATE
2002
IEEE
14 years 2 months ago
2002
IEEE
The systematic design of a high-speed, high-accuracy Nyquist A/D converter is proposed. The presented design methodology covers the complete flow and is supported by software tool...
HUC
2004
Springer
14 years 2 months ago
2004
Springer
Abstract. We present our approach to the design of two generations of outdoors device that enable visitors to view 3D historical reconstructions when exploring present day sites. R...
GECCO
2007
Springer
14 years 3 months ago
2007
Springer
Some auxiliary systems of next generation naval ships will utilize distributed automatic control. Such distributed control systems will use interconnected sensors, actuators, cont...
GECCO
2007
Springer
14 years 3 months ago
2007
Springer
The bin packing problem (BPP) is a real-world problem that arises in different industrial applications related to minimization of space or time. The aim of this research is to au...
ISCAS
2005
IEEE
14 years 2 months ago
2005
IEEE
: This paper presents a self-calibration method for designing high speed pipeline ADCs. Unlike all existing calibration algorithms, the proposed calibration does not insert any tes...