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» Test Pattern Generation Under Low Power Constraints
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VTS
2000
IEEE
113views Hardware» more  VTS 2000»
13 years 12 months ago
Hidden Markov and Independence Models with Patterns for Sequential BIST
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
Laurent Bréhélin, Olivier Gascuel, G...
DAC
2009
ACM
14 years 8 months ago
O-Router:an optical routing framework for low power on-chip silicon nano-photonic integration
In this work, we present a new optical routing framework, O-Router for future low-power on-chip optical interconnect integration utilizing silicon compatible nano-photonic devices...
Duo Ding, Yilin Zhang, Haiyu Huang, Ray T. Chen, D...
DAC
2009
ACM
14 years 2 months ago
O-Router: an optical routing framework for low power on-chip silicon nano-photonic integration
In this work, we present a new optical routing framework, O-Router for future low-power on-chip optical interconnect integration utilizing silicon compatible nano-photonic devices...
Duo Ding, Yilin Zhang, Haiyu Huang, Ray T. Chen, D...
CDC
2009
IEEE
112views Control Systems» more  CDC 2009»
13 years 11 months ago
Model predictive control for wind power generation smoothing with controlled battery storage
The aim of this study is to design a controller based on model predictive control (MPC) theory to smooth wind power generation along with the controlled storage of the wind energy ...
Muhammad Khalid, Andrey V. Savkin
DAC
2007
ACM
14 years 8 months ago
Variation Resilient Low-Power Circuit Design Methodology using On-Chip Phase Locked Loop
This paper presents a variation resilient circuit design technique for maintaining parametric yield of design under inherent variation in process parameters. We propose to utilize...
Kunhyuk Kang, Kee-Jong Kim, Kaushik Roy