88 search results - page 12 / 18 » Test Selection Based on High Level Fault Simulation for Mixe... |
JPDC
2000
13 years 7 months ago
2000
: SIMD arrays are likely to become increasingly important as coprocessors in domain specific systems as architects continue to leverage RAM technology in their design. The problem ...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
LCN
2002
IEEE
14 years 11 days ago
2002
IEEE
The availability of inexpensive wireless networking hardware (e.g., based on the IEEE 802.11 standards) has generated interest in a large class of wireless applications. Many appl...
BMCBI
2010
13 years 7 months ago
2010
Background: Generally speaking, different classifiers tend to work well for certain types of data and conversely, it is usually not known a priori which algorithm will be optimal ...
ICNP
2000
IEEE
13 years 12 months ago
2000
IEEE
In order to detect violations of end-to-end service level agreements (SLA) and to isolate trouble links and nodes based on a unified framework, managers of a service provider net...