—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Bec...
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
A current sensing device, namely Hall Effect MOSFET (HEMOS) is proposed. It is experimentally shown that the HEMOS enables a non-contacting, and non-disturbing current measurement...
Continuing trends in sensor, semiconductor and communication systems technology (smaller, faster, cheaper) make feasible very dense networks of fixed and mobile wireless devices ...
In this work, we present a new optical routing framework, O-Router for future low-power on-chip optical interconnect integration utilizing silicon compatible nano-photonic devices...
Duo Ding, Yilin Zhang, Haiyu Huang, Ray T. Chen, D...