29 search results - page 5 / 6 » Test compaction for transition faults under transparent-scan |
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
VTS
2003
IEEE
14 years 11 days ago
2003
IEEE
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
CDC
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract— In recent years, classical discrete event fault diagnosis techniques have been extended to Petri Net system models under partial order semantics [8], [9], [13]. In [14]...
ICSE
2005
IEEE-ACM
14 years 7 months ago
2005
IEEE-ACM
AGENDA is a tool set for testing relational database applications. An earlier prototype was targeted to applications consisting of a single query and included components for popul...
TVLSI
2008
13 years 7 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...