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search results - page 102 / 1171
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Test generation and minimization with
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ISSRE
2008
IEEE
96
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Software Engineering
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RUGRAT: Runtime Test Case Generation Using Dynamic Compilers
16 years 14 days ago
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www.cs.umd.edu
Ben Breech, Lori L. Pollock, John Cavazos
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115
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KBSE
2008
IEEE
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Software Engineering
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Heuristics for Scalable Dynamic Test Generation
16 years 14 days ago
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www.eecs.berkeley.edu
Jacob Burnim, Koushik Sen
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129
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FMICS
2007
Springer
111
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Formal Methods
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FMICS 2007
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Automatic Interoperability Test Case Generation Based on Formal Definitions
16 years 7 days ago
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Alexandra Desmoulin, César Viho
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TAP
2007
Springer
64
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Hardware
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Using Contracts and Boolean Queries to Improve the Quality of Automatic Test Generation
16 years 6 days ago
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se.ethz.ch
Lisa (Ling) Liu, Bertrand Meyer, Bernd Schoeller
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163
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DEPCOS
2006
IEEE
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Hardware
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DEPCOS 2006
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Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers
16 years 4 days ago
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home.mit.bme.hu
Zoltán Micskei, István Majzik
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