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    DEPCOS
    2006
    IEEE
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    Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

    14 years 6 months ago
    Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers
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    Zoltán Micskei, István Majzik
    claim paper
    Added 10 Jun 2010
    Updated 10 Jun 2010
    Type Conference
    Year 2006
    Where DEPCOS
    Authors Zoltán Micskei, István Majzik
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