5855 search results - page 11 / 1171 » Test generation and minimization with |
ICANNGA
2007
Springer
13 years 11 months ago
2007
Springer
Abstract. In the paper, a new method of decision tree learning for costsensitive classification is presented. In contrast to the traditional greedy top-down inducer in the proposed...
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
We present a two-level Boolean minimization tool (BOOM) based on a new implicant generation paradigm. In contrast to all previous minimization methods, where the implicants are ge...
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
g Test Suites via Operational Abstraction Michael Harder Jeff Mellen Michael D. Ernst MIT Lab for Computer Science 200 Technology Square Cambridge, MA 02139 USA {mharder,jeffm,mern...
ITC
1995
IEEE
13 years 11 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
ICML
1998
IEEE
14 years 8 months ago
1998
IEEE
Computational comparison is made between two feature selection approaches for nding a separating plane that discriminates between two point sets in an n-dimensional feature space ...