112 search results - page 13 / 23 » Test generation in VLSI circuits for crosstalk noise |
FCCM
2003
IEEE
14 years 28 days ago
2003
IEEE
Hardware simulation of channel codes offers the potential of improving code evaluation speed by orders of magnitude over workstation- or PC-based simulation. We describe a hardwar...
GLVLSI
2002
IEEE
14 years 18 days ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
SBCCI
2003
ACM
14 years 27 days ago
2003
ACM
As we scale down to deep submicron (DSM) technology, noise is becoming a metric of equal importance as power, speed, and area. Smaller feature sizes, low voltage, and high frequen...
CEC
2005
IEEE
14 years 1 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
VLSID
2003
IEEE
14 years 8 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...