112 search results - page 19 / 23 » Test generation in VLSI circuits for crosstalk noise |
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
VLSID
2005
IEEE
14 years 1 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
VLSI
2007
Springer
14 years 1 months ago
2007
Springer
— Software simulation remains the most used method for VHDL RTL functional verification. The functional verification process essentially consists of two parts. The first one is t...
VLSID
1998
IEEE
13 years 12 months ago
1998
IEEE
A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-d...
SBCCI
2005
ACM
14 years 1 months ago
2005
ACM
Temperature sensors and voltage references require cells that generate both PTAT (Proportional To Absolute Temperature) and NTC (Negative Temperature Coefficient) voltages. We pre...