112 search results - page 20 / 23 » Test generation in VLSI circuits for crosstalk noise |
TNN
2008
13 years 7 months ago
2008
Abstract--This paper investigates whether spike-timing-dependent plasticity (STDP) can minimize the effect of mismatch within the context of a depth-from-motion algorithm. To impro...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
ISQED
2003
IEEE
14 years 27 days ago
2003
IEEE
—As the operating frequency of digital systems increases and voltage swing decreases, it becomes very important to characterize and analyze power distribution networks (PDNs) acc...
DAC
2000
ACM
13 years 12 months ago
2000
ACM
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...