137 search results - page 11 / 28 » Test purpose generation in an industrial application |
TVLSI
2008
13 years 7 months ago
2008
We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
COMPSAC
2010
IEEE
13 years 5 months ago
2010
IEEE
Enterprise systems are load tested for every added feature, software updates and periodic maintenance to ensure that the performance demands on system quality, availability and res...
SEW
2003
IEEE
14 years 20 days ago
2003
IEEE
Model-based software has become quite popular in recent years, making its way into a broad range of areas, including the aerospace industry. The models provide an easy graphical i...
JCP
2006
13 years 7 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...