26 search results - page 4 / 6 » Testing: a roadmap |
TCAD
2008
13 years 10 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
WRAC
2005
Springer
14 years 4 months ago
2005
Springer
In this paper we argue that self-modifying code can become a better strategy for realizing long-lived autonomous software systems than static code, regardless how well it was valid...
DT
2006
13 years 11 months ago
2006
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
ACSAC
2010
IEEE
13 years 9 months ago
2010
IEEE
- The advanced metering infrastructure (AMI) is revolutionizing electrical grids. Intelligent AMI "smart meters" report real time usage data that enables efficient energy...
ICRA
2006
IEEE
14 years 4 months ago
2006
IEEE
— Research on robotic manipulation has mainly focused on manipulating rigid objects so far. However, many important application domains require manipulating deformable objects, e...