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TSMC
2008
138views more  TSMC 2008»
13 years 7 months ago
Fast Diagnosis With Sensors of Uncertain Quality
This correspondence presents an approach to the detection and isolation of component failures in large-scale systems. In the case of sensors that report at rates of 1 Hz or less, t...
Ozgur Erdinc, Craig Brideau, Peter Willett, Thiaga...
GLOBECOM
2008
IEEE
13 years 7 months ago
Security Rules Specification and Analysis Based on Passive Testing
Security is a critical issue in dynamic and open distributed environments such as network-based services or wireless networks. To ensure that a certain level of security is maintai...
Wissam Mallouli, Fayçal Bessayah, Ana R. Ca...
TASE
2009
IEEE
14 years 2 months ago
Fault-Based Test Case Generation for Component Connectors
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
Bernhard K. Aichernig, Farhad Arbab, Lacramioara A...
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
13 years 12 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
RIAO
2007
13 years 9 months ago
Exploring Interactive Information Retrieval: An Integrated Approach to Interface Design and Interaction Analysis
In this paper, we describe a novel methodology that integrates the design of the (i) user interface; (ii) interaction logger; and (iii) log analyzer. It is based on formalizing, v...
Gheorghe Muresan