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» Testing Digital Circuits with Constraints
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DELTA
2006
IEEE
14 years 2 months ago
Minimizing Simultaneous Switching Noise (SSN) using Modified Odd/Even Bus Invert Method
In high speed digital circuits, the inductive effect is more dominant compared to capacitive effect. In particular, as the technology is shrinking, the spacing between interconnec...
K. S. Sainarayanan, J. V. R. Ravindra, M. B. Srini...
FPL
2001
Springer
96views Hardware» more  FPL 2001»
14 years 1 months ago
System Level Tools for DSP in FPGAs
Abstract. Visual data ow environments are ideally suited for modeling digital signal processing (DSP) systems, as many DSP algorithms are most naturally speci ed by signal ow gra...
James Hwang, Brent Milne, Nabeel Shirazi, Jeffrey ...
DAC
2005
ACM
13 years 10 months ago
Unified high-level synthesis and module placement for defect-tolerant microfluidic biochips
Microfluidic biochips promise to revolutionize biosensing and clinical diagnostics. As more bioassays are executed concurrently on a biochip, system integration and design complex...
Fei Su, Krishnendu Chakrabarty
TODAES
2002
134views more  TODAES 2002»
13 years 8 months ago
False-noise analysis using logic implications
ct Cross-coupled noise analysis has become a critical concern in today's VLSI designs. Typically, noise analysis makes an assumption that all aggressing nets can simultaneousl...
Alexey Glebov, Sergey Gavrilov, David Blaauw, Vlad...
ASPDAC
2005
ACM
97views Hardware» more  ASPDAC 2005»
14 years 2 months ago
Opportunities and challenges for better than worst-case design
The progressive trend of fabrication technologies towards the nanometer regime has created a number of new physical design challenges for computer architects. Design complexity, u...
Todd M. Austin, Valeria Bertacco, David Blaauw, Tr...