- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, We...
Abstract. The question of equivalence has long vexed research in concurrency, leading to many different denotational- and bisimulation-based approaches; a breakthrough occurred wit...
Yuxin Deng, Rob J. van Glabbeek, Carroll Morgan, C...
As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which...
Kleene algebra with tests (KAT) is an equational system for program verification that combines Kleene algebra (KA), or the algebra of regular expressions, with Boolean algebra. I...
Although many of the software engineering activities can now be model-supported, the model is often missing in software development. We are interested in retrieving statemachine m...