7766 search results - page 180 / 1554 » Testing Nondeterminate Systems |
COMPSAC
2010
IEEE
13 years 7 months ago
2010
IEEE
Abstract--Test cost minimisation approaches have traditionally been devoted to minimising "execution costs", while maximising coverage or reliability. However, in a runti...
CSFW
2011
IEEE
12 years 9 months ago
2011
IEEE
—We present a statistical test for detecting information leaks in systems with continuous outputs. We use continuous mutual information to detect the information leakage from tri...
ISCAS
2005
IEEE
14 years 3 months ago
2005
IEEE
This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
ITC
1999
IEEE
14 years 1 months ago
1999
IEEE
The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...