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ET
2006

120views more ET 2006»

Automatic Test Pattern Generation for Resistive Bridging Faults

13 years 10 months ago

An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced s...

Piet Engelke, Ilia Polian, Michel Renovell, Bernd ...

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22

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ISSE
2008

72views Security Privacy» more ISSE 2008»

Patterns: from system design to software testing

13 years 10 months ago

Download www.cse.ohio-state.edu

Neelam Soundarajan, Jason O. Hallstrom, Guoqiang S...

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15

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COMPUTER
1999

67views more COMPUTER 1999»

Current Directions in Automatic Test-Pattern Generation

13 years 9 months ago

Download cadlab.ece.ucsb.edu

Kwang-Ting Cheng, Angela Krstic

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42

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BMCBI
2011

242views Artificial Intelligence» more BMCBI 2011»

Statistical Test of Expression Pattern (STEPath): a new strategy to integrate gene expression data with genomic information in i

13 years 5 months ago

Download www.biomedcentral.com

Background: In the last decades, microarray technology has spread, leading to a dramatic increase of publicly available datasets. The first statistical tools developed were focuse...

Paolo G. V. Martini, Davide Risso, Gabriele Sales,...

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24

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ATS
2005
IEEE

91views Hardware» more ATS 2005»

SOC Test Scheduling with Test Set Sharing and Broadcasting

14 years 3 months ago

Download www.ida.liu.se

11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...

Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...

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