1610 search results - page 36 / 322 » Testing Patterns |
ET
2002
13 years 9 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
ICASSP
2007
IEEE
14 years 1 months ago
2007
IEEE
In this paper, we propose a new feature extraction method, which is robust against rotation and histogram equalization for texture classification. To this end, we introduce the co...
VL
2009
IEEE
14 years 4 months ago
2009
IEEE
In many domains, decision makers want to find and understand patterns of events as these patterns often give insight into the causal relationships among events. Current systems to...
ITC
2000
IEEE
14 years 2 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
NAACL
2010
13 years 8 months ago
2010
I briefly describe a system for automatically creating an implemented grammar of a natural language based on answers to a web-based questionnaire, then present a grammar of Sahapt...