1610 search results - page 38 / 322 » Testing Patterns |
BMCBI
2006
13 years 10 months ago
2006
Background: Periodic processes, such as the circadian rhythm, are important factors modulating and coordinating transcription of genes governing key metabolic pathways. Theoretica...
KDD
2000
ACM
14 years 1 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
ITC
1992
IEEE
14 years 2 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
TCAD
2011
13 years 5 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
ASYNC
2006
IEEE
14 years 4 months ago
2006
IEEE
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using l...