A Small Test Generator for Large Designs

In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. the fraction of faults that are resolved, are comparable to or better than those reported previously in the literature. No preprocessing is required and the amount of memory needed is less than 100bytes per gate. The low memory requirements and high performance have been achieved by working with a larger but simpler search space, by simplifying decision making and backtracking and by using only implication techniques that are fast and that require no preprocessing.

• Type: Conference
• Year: 1992
• Where: ITC
• Authors: Sandip Kundu, Leendert M. Huisman, Indira Nair, Vijay S. Iyengar, Lakshmi N. Reddy
• Keywords: Hardware, ITC 1992, Low Memory Requirements, Medium Size Workstations, Test Pattern Generator