1610 search results - page 58 / 322 » Testing Patterns |
ICEIS
2009
IEEE
13 years 7 months ago
2009
IEEE
: This paper presents the development of an Artificial Neural Network system for Dynamometer Card pattern recognition in oil well rod pump systems. It covers the establishment of p...
VTS
2000
IEEE
14 years 2 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
ERSHOV
2009
Springer
14 years 4 months ago
2009
Springer
Abstract. The article concerns problems of formulating standard requirements to implementations of mathematical functions working with floating-point numbers and conformance test ...
ICPR
2002
IEEE
14 years 3 months ago
2002
IEEE
Testing for uniformity of multivariate data is the initial step in exploratory pattern analysis. We propose a new uniformity testing method, which first computes the maximum (sta...
VTS
2007
IEEE
14 years 4 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...