1610 search results - page 59 / 322 » Testing Patterns |
ISVC
2007
Springer
14 years 4 months ago
2007
Springer
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...
ICCD
2003
IEEE
14 years 7 months ago
2003
IEEE
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
DCC
2004
IEEE
14 years 1 months ago
2004
IEEE
Compressed pattern matching is an emerging research area that addresses the following problem: given a file in compressed format and a pattern, report the occurrence(s) of the pat...
ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
Faster-than-at-speed test have been proposed to detect small delay defects. While these techniques increase the test frequency to reduce the positive slack of the path, they exace...
ITC
1993
IEEE
14 years 2 months ago
1993
IEEE
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...