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» Testing Reactive Probabilistic Processes
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VLSID
2007
IEEE
131views VLSI» more  VLSID 2007»
14 years 7 months ago
Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit C...
CCS
1998
ACM
13 years 11 months ago
A Probabilistic Poly-Time Framework for Protocol Analysis
We develop a framework for analyzing security protocols in which protocol adversaries may be arbitrary probabilistic polynomial-time processes. In this framework, protocols are wr...
Patrick Lincoln, John C. Mitchell, Mark Mitchell, ...
FOSSACS
2003
Springer
14 years 18 days ago
An Intrinsic Characterization of Approximate Probabilistic Bisimilarity
In previous work we have investigated a notion of approximate bisimilarity for labelled Markov processes. We argued that such a notion is more realistic and more feasible to compu...
Franck van Breugel, Michael W. Mislove, Joël ...
ECCV
2002
Springer
14 years 9 months ago
Exemplar-Based Face Recognition from Video
Abstract. A new exemplar-based probabilistic approach for face recognition in video sequences is presented. The approach has two stages: First, Exemplars, which are selected repres...
Shaohua Kevin Zhou, Volker Krüger
INFOCOM
2009
IEEE
14 years 2 months ago
Opportunistic Processing and Query of Motion Trajectories in Wireless Sensor Networks
—We study the problem of in-network processing and queries of trajectories of moving targets in a sensor network. The main idea is to exploit the spatial coherence of target traj...
Dengpan Zhou, Jie Gao