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FMCO
2006
Springer
128views Formal Methods» more  FMCO 2006»
13 years 11 months ago
Model-Based Test Selection for Infinite-State Reactive Systems
This paper addresses the problem of off-line selection of test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of re...
Bertrand Jeannet, Thierry Jéron, Vlad Rusu
ITC
2003
IEEE
120views Hardware» more  ITC 2003»
14 years 1 months ago
Test Vector Generation Based on Correlation Model for Ratio-Iddq
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota
ICST
2008
IEEE
14 years 2 months ago
Model-Based Tests for Access Control Policies
We present a model-based approach to testing access control requirements. By using combinatorial testing, we first automatically generate test cases from and without access contro...
Alexander Pretschner, Tejeddine Mouelhi, Yves Le T...
ITC
2003
IEEE
114views Hardware» more  ITC 2003»
14 years 1 months ago
Test-Based Model Generation For Legacy Systems
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes....
Hardi Hungar, Tiziana Margaria, Bernhard Steffen
KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka