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» Testing Semantics: Connecting Processes and Process Logics
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117
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ASPDAC
2001
ACM
82views Hardware» more  ASPDAC 2001»
15 years 7 months ago
Towards the logic defect diagnosis for partial-scan designs
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
Shi-Yu Huang
ITSSA
2006
116views more  ITSSA 2006»
15 years 4 months ago
A Genetic Programming Approach to Automated Test Generation for Object-Oriented Software
: This article proposes a new method for creating test software for object-oriented systems using a genetic programming approach. It is believed that this approach is advantageous ...
Arjan Seesing, Hans-Gerhard Groß
ACL
1998
15 years 5 months ago
A Test Environment for Natural Language Understanding Systems
The Natural Language Understanding Engine Test Environment (ETE) is a GUI software tool that aids in the development and maintenance of large, modular, natural language understand...
Li Li, Deborah A. Dahl, Lewis M. Norton, Marcia C....
152
Voted
WISES
2003
15 years 5 months ago
Built-In Fault Injectors - The Logical Continuation of BIST?
— With the increasing number of embedded computer systems being used in safety critical applications the testing and assessment of a system’s fault tolerance properties become ...
Andreas Steininger, Babak Rahbaran, Thomas Handl
CCS
2011
ACM
14 years 4 months ago
Trace equivalence decision: negative tests and non-determinism
We consider security properties of cryptographic protocols that can be modeled using the notion of trace equivalence. The notion of equivalence is crucial when specifying privacy-...
Vincent Cheval, Hubert Comon-Lundh, Stéphan...