207 search results - page 11 / 42 » Testing Transition Systems with Input and Output Testers |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
STOC
2004
ACM
14 years 7 months ago
2004
ACM
The main result of this paper is a near-optimal derandomization of the affine homomorphism test of Blum, Luby and Rubinfeld (Journal of Computer and System Sciences, 1993). We sho...
ENTCS
2010
13 years 7 months ago
2010
Component based development allows to build software upon existing components and promises to improve software reuse and reduce costs. To gain reliability of a component based sys...
ISSRE
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper we present a method for automatically testing interactive multimodal systems1 . The proposed approach was originally dedicated to synchronous programming which is ma...
ISSTA
2010
ACM
13 years 7 months ago
2010
ACM
Applications that process complex inputs often react in different ways to changes in different regions of the input. Small changes to forgiving regions induce correspondingly smal...