207 search results - page 14 / 42 » Testing Transition Systems with Input and Output Testers |
TCAD
2002
13 years 7 months ago
2002
We develop a general methodology to analyze crosstalk effects that are likely to cause errors in deep submicron high speed circuits. We focus on crosstalk due to capacitive coupli...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
DATE
2010
IEEE
14 years 19 days ago
2010
IEEE
—This paper presents a robust, low-cost ADC code hit counting technique to record the number of times each ADC output code word appears with respect to the ramp input. Using a sm...
CORR
2010
Springer
13 years 7 months ago
2010
Springer
The usefulness of parameterized algorithmics has often depended on what Niedermeier has called, "the art of problem parameterization." In this paper we introduce and expl...
DSVIS
2008
Springer
13 years 9 months ago
2008
Springer
Abstract. Current multi-display environments (MDEs) can be composed of displays with different characteristics (e.g. resolution, size) located in any position and at different angl...