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121
Voted
TE
2010
14 years 9 months ago
2010
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
113
Voted
ICCAD
1995
IEEE
15 years 6 months ago
1995
IEEE
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
116
Voted
PLDI
2012
ACM
13 years 5 months ago
2012
ACM
To report a compiler bug, one must often find a small test case that triggers the bug. The existing approach to automated test-case reduction, delta debugging, works by removing ...
135
Voted
TASE
2009
IEEE
15 years 9 months ago
2009
IEEE
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
121
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FORMATS
2009
Springer
15 years 9 months ago
2009
Springer
For software development, testing is still the primary choice for investigating the correctness of a system. Automated testing is of utmost importance to support continuous integra...