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TE
2010
168views more  TE 2010»
13 years 2 months ago
Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
John Hu, Mark Haffner, Samantha Yoder, Mark Scott,...
ICCAD
1995
IEEE
120views Hardware» more  ICCAD 1995»
13 years 11 months ago
Pattern generation for a deterministic BIST scheme
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...
PLDI
2012
ACM
11 years 10 months ago
Test-case reduction for C compiler bugs
To report a compiler bug, one must often find a small test case that triggers the bug. The existing approach to automated test-case reduction, delta debugging, works by removing ...
John Regehr, Yang Chen, Pascal Cuoq, Eric Eide, Ch...
TASE
2009
IEEE
14 years 2 months ago
Fault-Based Test Case Generation for Component Connectors
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
Bernhard K. Aichernig, Farhad Arbab, Lacramioara A...
FORMATS
2009
Springer
14 years 2 months ago
Exploiting Timed Automata for Conformance Testing of Power Measurements
For software development, testing is still the primary choice for investigating the correctness of a system. Automated testing is of utmost importance to support continuous integra...
Matthias Woehrle, Kai Lampka, Lothar Thiele