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AICT
2006
IEEE
100views Communications» more  AICT 2006»
14 years 2 months ago
A Concept Model for Computer-based Spoken Language Tests
Spoken language education plays an important role in modern language courses. Computer-based spoken language test systems provide a convenient, efficient and reliable approach to ...
Yijian Wu, Wenyun Zhao, Xin Peng, Yunjiao Xue
ICSM
2005
IEEE
14 years 1 months ago
Contract-Based Mutation for Testing Components
Testing plays an important role in the maintenance of Component Based Software Development. Test adequacy for component testing is one of the hardest issues for component testing....
Ying Jiang, Shan-Shan Hou, Jinhui Shan, Lu Zhang, ...
SWAT
2004
Springer
98views Algorithms» more  SWAT 2004»
14 years 1 months ago
Tight Approximability Results for Test Set Problems in Bioinformatics
In this paper, we investigate the test set problem and its variations that appear in a variety of applications. In general, we are given a universe of objects to be “distinguish...
Piotr Berman, Bhaskar DasGupta, Ming-Yang Kao
ISCAS
1999
IEEE
106views Hardware» more  ISCAS 1999»
14 years 7 days ago
Test pattern generation for width compression in BIST
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Paulo F. Flores, Horácio C. Neto, K. Chakra...
EURODAC
1995
IEEE
164views VHDL» more  EURODAC 1995»
13 years 11 months ago
Bottleneck removal algorithm for dynamic compaction and test cycles reduction
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
Srimat T. Chakradhar, Anand Raghunathan