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SCAM
2008
IEEE
14 years 2 months ago
Constructing Subtle Faults Using Higher Order Mutation Testing
Traditional mutation testing considers only first order mutants, created by the injection of a single fault. Often these first order mutants denote trivial faults that are easil...
Yue Jia, Mark Harman
DATE
2006
IEEE
110views Hardware» more  DATE 2006»
14 years 2 months ago
An improved RF loopback for test time reduction
In this work a method to improve the loopback test used in RF analog circuits is described. The approach is targeted to the SoC environment, being able to reuse system resources i...
Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Su...
VLSID
2005
IEEE
107views VLSI» more  VLSID 2005»
14 years 1 months ago
Design, Testing, and Applications of Digital Microfluidics-Based Biochips
Microfluidics-based biochips offer a promising platform for massively parallel DNA analysis, automated drug discovery, and real-time biomolecular recognition. The first part of th...
Krishnendu Chakrabarty
COMPSAC
2003
IEEE
14 years 1 months ago
A Strategy for Selecting Synchronization Sequences to Test Concurrent Object-Oriented Software
Testing is the most commonly used approach to the assurance of software quality and reliability. The testing of object-oriented software is much more complex than that of conventi...
Huo Yan Chen, Yu Xia Sun, T. H. Tse
ICSM
2003
IEEE
14 years 1 months ago
Testing with Respect to Concerns
Often the code regions that are assigned for a maintenance task do not follow the modularization of the original application program, but instead include parts of code from many d...
Amie L. Souter, David Shepherd, Lori L. Pollock