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ISMVL
2005
IEEE
90views Hardware» more  ISMVL 2005»
14 years 1 months ago
Test Generation and Fault Localization for Quantum Circuits
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
Marek A. Perkowski, Jacob Biamonte, Martin Lukac
ISORC
2005
IEEE
14 years 1 months ago
Automated Model Checking and Testing for Composite Web Services
Web Services form a new distributed computing paradigm. Collaborative verification and validation are important when Web Services from different vendors are integrated together to...
Hai Huang, Wei-Tek Tsai, Raymond A. Paul, Yinong C...
EURODAC
1990
IEEE
92views VHDL» more  EURODAC 1990»
14 years 1 days ago
Accelerated test pattern generation by cone-oriented circuit partitioning
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
Torsten Grüning, Udo Mahlstedt, Wilfried Daeh...
DAC
2005
ACM
13 years 10 months ago
Matlab extensions for the development, testing and verification of real-time DSP software
The purpose of this paper is to present the required tools for the development, testing and verification of DSP software in Matlab. The paper motivates a DSP Simulator concept tha...
David P. Magee
PTS
2008
98views Hardware» more  PTS 2008»
13 years 9 months ago
Modular System Verification by Inference, Testing and Reachability Analysis
Verification of a modular system composed of communicating components is a difficult problem, especially when the models of the components are not available. Conventional testing t...
Roland Groz, Keqin Li 0002, Alexandre Petrenko, Mu...