6941 search results - page 172 / 1389 » Testing as a Certification Approach |
PTS
1993
13 years 9 months ago
1993
The signal SAVE construct is one of the features distinguishing SDL from convent specification and programming languages. On the other hand, this feature increase testing SDL-spec...
CATA
2009
13 years 9 months ago
2009
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
ET
2002
13 years 7 months ago
2002
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 5 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
HCI
2009
13 years 5 months ago
2009
Emotion is an important mental and physiological state, influencing cognition, perception, learning, communication, decision making, etc. It is considered as a definitive important...