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DATE
1999
IEEE
120views Hardware» more  DATE 1999»
14 years 1 days ago
FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
ICST
2008
IEEE
14 years 2 months ago
Automated Session Data Repair for Web Application Regression Testing
This paper introduces an approach to web application regression testing, based upon repair of user session data. The approach is entirely automated. It consists of a white box exa...
Mark Harman, Nadia Alshahwan
KI
2006
Springer
13 years 7 months ago
Gray Box Robustness Testing of Rule Systems
Due to their simple and intuitive manner rules are often used for the implementation of intelligent systems. Besides general methods for the verification and validation of rule sys...
Joachim Baumeister, Jürgen Bregenzer, Frank P...
AMOST
2005
ACM
14 years 1 months ago
Modeling requirements for combinatorial software testing
The combinatorial approach to software testing uses models to generate a minimal number of test inputs so that selected combinations of input values are covered. The most common c...
Christopher M. Lott, Ashish Jain, Siddhartha R. Da...
APSEC
2009
IEEE
14 years 2 months ago
Directed Test Suite Augmentation
Abstract—As software evolves, engineers use regression testing to evaluate its fitness for release. Such testing typically begins with existing test cases, and many techniques h...
Zhihong Xu, Gregg Rothermel