6941 search results - page 92 / 1389 » Testing as a Certification Approach |
CSREAESA
2009
13 years 8 months ago
2009
A Built-In Self-Test (BIST) approach is presented for the Internal Configuration Access Port (ICAP) and Frame Error Correcting Code (ECC) logic cores embedded in Xilinx Virtex-4 an...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper presents a new approach that allows remote testing and diagnosis of complex (Systems-on-Chip) and embedded IP cores. The approach extends both on-chip design-for-test (...
EURODAC
1994
IEEE
13 years 12 months ago
1994
IEEE
An approach for stuck-at-i and delay-fault testing of redundant circuits without modifying the logic is proposed. The only requirement is the ability to control both phases of eac...
COMCOM
1999
13 years 7 months ago
1999
If a test does not produce the expected output, the incorrect output may have been caused by an earlier state transfer failure. Ghedamsi and von Bochmann [1992] and Ghedamsi et al...
ICPR
2000
IEEE
14 years 8 months ago
2000
IEEE
This paper addresses detection of imperfections in repetitive regular structures (textures). Humans can easily find such defects without prior knowledge of the `good' pattern...